|Address||University Montpellier 2 / CNRS LIRMM 161 Rue ADA 34392 Montpellier 2 France|
|Phone|| +33 467 418 527
+33 467 418 500
Dr. Pascal Nouet received his MSc and PhD degrees in Electronics Engineering from University Montpellier II, respectively in 1988 and 1991. He joined the « Laboratoire d’Informatique, de Robotique et de Microélectronique » (LIRMM), Montpellier, France, in 1992. He worked in various research programs that have addressed Electron-Beam Testing of ICs, effects of radiations on CMOS circuits, characterization and modeling of CMOS devices and interconnects, Electro-Static Discharges in VLSI circuits... His current research addresses design, test and reliability of integrated systems with a special interest for heterogeneous systems (MEMS and NEMS). He is presently leading the research group on “MEMS design and test” within the Microelectronics department of LIRMM with a particular interest in CMOS-MEMS modeling and integration.
He is Professor in the Electronics Engineering Department of the Polytechnic University School of University Montpellier 2, currently head of both the Montpellier’s cluster and the national resource center for design and test in Microelectronics of the National Coordination for Education in Microelectronics (CNFM). He teaches mainly in the fields of Analog Integrated Circuit Design and MEMS design.
He is or has been mentoring a total of 25 PhD students and has been author or co-author of three patents and numerous scientific papers. Among them, more than 150 have been published in international journals or have been presented in major international conferences.
Prof. Nouet is serving as a reviewer for several IEEE journals, as a program committee member of International Conferences and as a referee for public-funded projects in France, UK and Canada.