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Education and Innovation in Embedded Systems Design

USI Università della Svizzera italiana, USI Faculty of Informatics, Advanced Learning and Research Institute USI Università della Svizzera italiana USI Faculty of Informatics USI Advanced Learning and Research Institute
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Livi, L., and C. Alippi, "One-Class Classification Through Mutual Information Minimization", IEEE-INNS International Joint Conference on Neural Networks (IJCNN16), Vancouver, Canada, 07/2016.
Livi, L., and C. Alippi, "One-class classifiers based on entropic spanning graphs", IEEE Transactions on Neural Networks and Learning Systems, vol. 28, issue 12, pp. 2846 - 2858, 11/2016, 2017.
Alippi, C., S. Ntalampiras, and M. Roveri, "Online Model-free Sensor Fault Identification and Dictionary Learning in Cyber-Physical Systems", IEEE-INNS International Joint Conference on Neural Networks (IJCNN16), Vancouver, Canada, 07/2016.
Derin, O., D. Kabakci, and L. Fiorin, "Online Task Remapping Strategies for Fault-tolerant Network-on-Chip Multiprocessors", NOCS '11: Proceedings of the Fifth ACM/IEEE International Symposium on Networks-on-Chip, Pittsburgh, Pennsylvania, USA, pp. 1–8, 05/2011.
Rigoni, E., C. Kavka, A. Turco, G. Palermo, C. Silvano, V. Zaccaria, and G. Mariani, "Optimization Algorithms for Embedded System Design Space Exploration", Multi-objective design space exploration of multiprocessor SoC architectures: the MULTICUBE approach, New York, USA, Springer, 2011.
Kaitović, I., and M. Malek, "Optimizing Failure Prediction to Maximize Availability", 13th IEEE International Conference on Autonomic Computing (ICAC), Würzburg, Germany, 07/2016.
Balać, K., M. Prevostini, and M. Malek, "Optimizing Sensor Nodes Placement for Fault-tolerant Trilateration-based Localization", IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), Zhangjiajie, China, 11/2015.
Mariani, G., G. Palermo, C. Silvano, and V. Zaccaria, "OSCAR: an Optimization Methodology Exploiting Spatial Correlation in Multi-core Design Space", IEEE Transactions on Computer-Aided Design, vol. 21, issue 5, no. -: IEEE, pp. 740-753, 05/2012.