Export 2 results:
Author Title Type [ Year] Filters: First Letter Of Title is C and Author is Israel Koren [Clear All Filters]
"A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks",
IEEE Transactions on Emerging Topics in Computing, vol. PP, issue 99, 04/2014.
"Can knowledge regarding the presence of countermeasures against fault attacks simplify power attacks on cryptographic devices?",
Proceedings of 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS 08), October 1-3, 2008.