Export 1 results:
Author Title Type [ Year] Filters: Keyword is fault tolerance and Author is Paolo Ienne [Clear All Filters]
"Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits",
proceedings of: '22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'07), Rome, Italy, September 26-28, 2007.