| Title | Simulation and Analysis of Negative-Bias Temperature Instability Aging on Power Analysis Attacks |
| Publication Type | Conference Paper |
| Year of Publication | 2015 |
| Authors | Guo, X., N. Karimi, F. Regazzoni, C. Jin, and R. Karri |
| Conference Name | IEEE Int. Symposium on Hardware-Oriented Security and Trust |
| Date Published | 05/2015 |
| Conference Location | McLean, VA, USA |
