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Education and Innovation in Embedded Systems Design

USI Università della Svizzera italiana, USI Faculty of Informatics, Advanced Learning and Research Institute USI Università della Svizzera italiana USI Faculty of Informatics USI Advanced Learning and Research Institute
TitleSimulation and Analysis of Negative-Bias Temperature Instability Aging on Power Analysis Attacks
Publication TypeConference Paper
Year of Publication2015
AuthorsGuo, X., N. Karimi, F. Regazzoni, C. Jin, and R. Karri
Conference NameIEEE Int. Symposium on Hardware-Oriented Security and Trust
Date Published05/2015
Conference LocationMcLean, VA, USA